En la actualidad, la rápida evolución de la capacidad de integración en tecnologías CMOS ha llevado a la industria de los circuitos integrados hacia sistemas complejos en los que coexisten bloques analógicos con componentes digitales [1]. Esto ha dado lugar a los, así llamados, SoCs (Sistemas on-chip, Systems on-Chip) en los que un sistema...
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April 16, 2015 (v1)PublicationUploaded on: December 4, 2022
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May 9, 2018 (v1)Publication
This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.
Uploaded on: December 4, 2022 -
March 27, 2018 (v1)Publication
This work presents an efficient implementation of a BIST solution for frequency characterization of analog systems. It allows a complete characterization in terms of magnitude and phase, including also harmonic distortion and offset measurements. Signal generation is performed using a modified filter, while response evaluation is based on...
Uploaded on: March 27, 2023 -
March 21, 2018 (v1)Publication
This work presents a technique for the generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. Two integrated demonstrators are presented to show the feasibility of the approach. The proposed generation technique is based on a modified analog filter that provides a sinusoidal output as the response to...
Uploaded on: December 4, 2022 -
September 19, 2017 (v1)Publication
This work presents a technique for the on- chip generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. The proposed generation technique consists of a modi ed low-order analog lter, that provides a sinusoidal out- put as response to a DC input, combined with a har- monic cancellation strategy to...
Uploaded on: March 27, 2023 -
March 27, 2018 (v1)Publication
A simple on-chip procedure for testing embedded RF blocks is presented. It is based on the detection and spectral analysis of the two-tone response envelope of the device under test (DUT). A main difference with similar methods is its inherent simplicity, avoiding a preprocessing stage and resorting to simpler circuitry to process the envelope....
Uploaded on: March 27, 2023