In this study, Mn silicate (MnSiO3) barrier layers were formed on thermally grown SiO2 using both metallic Mn and oxidized Mn films, in order to investigate the role of oxygen in determining the extent of the interaction between the deposited Mn and the SiO2 substrate. Using x-ray photoelectron spectroscopy, it has been shown that a metallic Mn...
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September 16, 2021 (v1)PublicationUploaded on: December 4, 2022
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September 30, 2021 (v1)Publication
X-ray photoelectron spectroscopy (XPS) has been used to investigate the thermodynamic stability of Cu layers deposited onto Mn silicate (MnSiO3) barrier layers formed on SiO2 surfaces. Using a fully in situ growth and analysis experimental procedure, it has been shown that 1nm Cu layers do not chemically react with ultra thin ( 2.6 nm) MnSiO3...
Uploaded on: March 25, 2023