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BUTTAY , Cyril

Last name: BUTTAY

First name: Cyril

June 10, 2024 (v1)

Conference paper

Metadata-only

Carrier density analysis in stressed n-doped GaN layers on sapphire

Ignoumba-Ignoumba, Ndembi Sonneville, Camille Frayssinet, Éric

Using micro-Raman spectroscopy on MOCVD slightly n-doped GaN on sapphire structures (1.5 x 10$^{15}$ cm$^{-3}$ – 6.5 x 10$^{15}$ cm$^{-3}$), we report a method to dissociate biaxial stress contribution from n carrier concentration contribution in A1(LO) Raman peak position. For all characterized samples, the main Raman peaks A$_1$(LO) and...

Uploaded on: July 10, 2024