Grâce à une nouvelle combinaison des modes de croissances EJM et MOCVD nous avons réalisés des guides d'onde à base d'AlN et de GaN mono-cristalins sur saphir qui présentent de très faibles pertes à la propagation. Nous avons pu démontrer que ces guides ont des possibilités très intéressantes de doublage de fréquence dans le proche IR et le...
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July 4, 2017 (v1)Conference paperUploaded on: February 28, 2023
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May 3, 2018 (v1)Publication
En combinant EJM et EPVOM nous avons réalisés des guides d'onde à base d'AlN et de GaN mono-cristallins qui présentent de très faibles pertes à la propagation et des possibilités d'accord de phase modal intéressantes. A partir de ces structures, nous avons réalisés des guides canaux dont nous présentons les performances linéaires et non...
Uploaded on: December 4, 2022 -
July 5, 2023 (v1)Conference paper
The technology of GaN HEMT structures is the subject of major developments for large-gap power components. However, it is necessary to develop innovative technological solutions to obtain high-performance normally-off devices. We present a new normally-off structure based on a nanostructured P-GaN multi-well gate. The design of this structure,...
Uploaded on: June 16, 2023 -
December 2, 2022 (v1)Journal article
In this study, AlN epilayers were grown by ammonia-assisted molecular beam epitaxy on 3 nm h-BN grown on c-sapphire substrates. Their structural properties were investigated by comparing as-grown and postgrowth annealed layers. The role of annealing on the crystalline quality and surface morphology was studied as a function of AlN thickness and...
Uploaded on: October 13, 2023 -
2017 (v1)Journal article
International audience
Uploaded on: February 28, 2023 -
November 2022 (v1)Journal article
(111)-oriented cubic polytypes of silicon carbide (3C-SiC) films were grown by chemical vapor deposition on 2H-AlN(0001)/Si(111) and 2H-AlN(0001)/Si(110) templates. The structural and electrical properties of the films were investigated. For film thicknesses below 300 nm, the 3C-SiC material deposited on 2H-AlN/Si presented a better structural...
Uploaded on: October 15, 2023 -
October 28, 2022 (v1)Journal article
In the first part of this paper, we present a model that explains and determines quantitatively the twists between nucleation islands in the case of a Volmer–Weber heteroepitaxial growth of tetrahedrally coordinated semiconductors along hexagonal orientations. These twists are caused by the network of the screw components of the 60° misfit...
Uploaded on: February 22, 2023 -
July 3, 2023 (v1)Conference paper
National audience
Uploaded on: October 11, 2023