Compact Si–Ti–O and Si–Zr–O mixed oxide thin films are studied by optical characterization refractive index, band gap energy and local probes Auger parameter obtained by x-ray photoelectron spectroscopy . Interpretation of the obtained results is discussed in the framework of the classical dielectric theory that correlates the macroscopic...
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February 21, 2018 (v1)PublicationUploaded on: March 27, 2023
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February 10, 2023 (v1)Publication
In this work we present a new concept for energy sensitive radiation-beam scintillator detectors based on a luminescent multilayer design, where each layer within the stack consists of a rare-earth-doped highly transparent oxide. For a given type of particle beam (i.e., protons, particles, etc.), its penetration depth, and therefore its...
Uploaded on: March 1, 2023 -
April 24, 2018 (v1)Publication
Quantification of light elements content in thin films is an important and difficult issue in many technological fields such as polymeric functional thin films, organic thin film devices, biomaterials, and doped semiconducting structures. Light elements are difficult to detect with techniques based on X-ray emission, such as energy dispersive...
Uploaded on: December 5, 2022 -
February 5, 2021 (v1)Publication
A new approach is presented to produce amorphous porous silicon coatings (a-pSi) with closed porosity by magnetron sputtering of a silicon target. It is shown how the use of He as the process gas at moderated power (50-150 W RF) promotes the formation of closed nanometric pores during the growth of the silicon films. The use of oblique-angle...
Uploaded on: March 26, 2023