GIELEN , Georges

In nanometer complementary metal-oxide-semiconductor technologies, worst-case design methods and response-surface-based yield optimization methods face challenges in accuracy. Monte-Carlo (MC) simulation is general and accurate for yield estimation, but its efficiency is not high enough to make MC-based analog yield optimization, which requires...

A symbolic analysis tool is presented that generates simplified symbolic expressions for the small-signal characteristics of large analog integrated circuits. The expressions are approximated while they are computed, so that only those terms are generated which remain in the final expression. This principle causes drastic savings in CPU time...