GONTARD , Lionel C.

There is great interest in developing novel position-sensitive direct detectors for transmission electron microscopy (TEM) that do not rely in the conversion of electrons into photons. Direct imaging improves contrast and efficiency and allows the operation of the microscope at lower energies and at lower doses without loss in resolution, which...

This article introduces a CMOS charge detector tailored for measuring ionizing radiation in a wide range of fluences. It represents an entirely on-chip solution based on capacitive sensing. It was fabricated using a standard 0.18 μm CMOS process and employs Metal-insulator-Metal (MiM) capacitor arrays to attain high matching, low leakage, and...

This paper reports the use of vertically stacked photodiodes as compact solid-state spectrometers for transmission scanning electron microscopy. SEM microscopes operate by illuminating the sample with accelerated electrons. They can have one or more solid-state sensors. In this work we have tested a set of stacked photodiodes fabricated in a...

An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). Real samples tend to follow a size distribution commonly linked to the synthesis process used and in turn to their functional properties. This study presents an algorithm for measuring particle size distributions in electron...

In our previous works, Co-B-O and Co-Ru-B-O ultrafine powders with variable Ru content (xRu) were studied as catalysts for hydrogen generation through sodium borohydride hydrolysis. These materials have shown a complex nanostructure in which small Co-Ru metallic nanoparticles are embedded in an amorphous matrix formed by Co-Ru-B-O based phases...