LE GALL , Yann

We report an uncommon study of the insertion of distributions of both volume fraction and depolarization factors in the modeling of the plasmonic properties of implanted Ag nanoparticles (Ag-NPs) in a SiO2 layer when using spectroscopic ellipsometry (SE) characterization. The Ag-NPs were embedded in the SiO2 matrix by Ag+ ion implantation at...