MOGOLLÓN , J.m.

Propagation induced pulse broadening (PIPB) effect is becoming a major concern for electronic designers since new technologies are fast enough to propagate and capture Single Event Transients (SET). In this paper, we explore the influence of the MOSFET threshold voltage (VT) on PIPB effect by TCAD simulating the propagation of an SET after an...

This work presents the determination of a Pulsed Laser SEU Cross-Section (Count Statistics). In this work, a coincidence detector has been used to count fault events by comparing the digital VLSI circuit under test with a replica of the design running on a control FPGA. A SEU is declared when a specific fault pattern is detected. The target...