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OCHALSKI , Tj

Last name: OCHALSKI

First name: Tj

May 31, 1999 (v1)

Journal article

Metadata-only

Photoreflectance investigations of the bowing parameter in AlGaN alloys lattice-matched to GaN.

Ochalski, Tj Gil, Bernard Lefebvre, Pierre

Room temperature photoreflectance investigations have been performed on a series of AlGaN layers grown both by metalorganic vapor phase epitaxy and molecular beam epitaxy on c-plane sapphire substrates. The aluminum composition was ranging between 0% and 20%, and was determined independently in the different growth laboratories, by various...

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