POSTEL-PELLERIN , J.

In this paper we propose and develop a complete solution to measure very low tunneling currents in Non-Volatile Memories, based on the Floating-Gate technique. We aim at using very basic tools (power supply, multimeter...) but still having a very good current resolution. The key node of our solution is that the experiment is led in a very...

Nowadays, the study of physical mechanisms that occur during Flash memory cell life is mandatory when reaching the 40nm and beyond nodes in terms of reliability. In this paper we carry out a complete experimental method to extract the floating gate potential evolution during the cell aging. The dynamic current consumption during a Channel Hot...