November 10, 2022 (v1)
Publication
(Scanning) transmission electron microscopy, (S)TEM, offers a powerful characterization tool based on electron-matter interactions, highly valuable in materials science. However, the possible electron beam induced damage during (S)TEM measurements hinders the analysis of soft materials, such as acrylic resins. Importantly, acrylic resins offer...
Uploaded on: March 24, 2023