Published December 23, 2008
| Version v1
Journal article
Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas
Description
This article presents a quasi full 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas. The measurement of an omnidirectional antenna is reported and shows promising results. The radiation of the probe itself as well as the effects of a connector feeding the antenna are also studied.
Abstract
International audience
Additional details
- URL
- https://hal.science/hal-00366584
- URN
- urn:oai:HAL:hal-00366584v1
- Origin repository
- UNICA