Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas

Ranvier, S.; Kyrö, M.; Icheln, C.; Luxey, Cyril; Staraj, Robert; Vainikainen, P.

Published December 23, 2008 | Version v1

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Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas

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Laboratoire d'Electronique, Antennes et Télécommunications (LEAT) ; Université Nice Sophia Antipolis (1965 - 2019) (UNS) ; COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-Centre National de la Recherche Scientifique (CNRS)

This article presents a quasi full 3‐D on‐wafer radiation pattern measurement system for 60 GHz antennas. The measurement of an omnidirectional antenna is reported and shows promising results. The radiation of the probe itself as well as the effects of a connector feeding the antenna are also studied.

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URL: https://hal.science/hal-00366584
URN: urn:oai:HAL:hal-00366584v1

Origin repository: UNICA

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Compact 3-D On-Wafer Radiation Pattern Measurement System for 60 GHz Antennas

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