Published 2014 | Version v1
Publication

Mesoporous Titanium Dioxide Thin Layers for Gas Sensor Applications: Vacuum Deposition and Electrochemical Anodization

Description

Titanium dioxide (TiO2) thin films were prepared by means of Anodic Spark Deposition (ASD) from thin and flat metallic titanium (Ti) films pre-deposited on high quality quartz slides by electron beam evaporation. AFM analysis indicates the formation of uniform mesoporous layers and a definite increase (about 50%) of the film thickness upon anodisation. The oxide mesoporous films have been characterized by XPS and Raman spectroscopy. Raman spectra of mesoporous TiO2 films were characterized by well-defined peaks related to anatase structure. An incomplete phase transition from anatase to rutile was observed upon annealing at temperatures up to 900 °C for 3h.

Additional details

Identifiers

URL
http://hdl.handle.net/11567/776833
URN
urn:oai:iris.unige.it:11567/776833

Origin repository

Origin repository
UNIGE