Published November 30, 2017 | Version v1
Conference paper

Determination of reverse cross-relaxation process constant in Tm-doped glass and evaluation of its impact on highly-doped devices

Description

International audience

Additional details

Identifiers

URL
https://hal.archives-ouvertes.fr/hal-01860696
URN
urn:oai:HAL:hal-01860696v1

Origin repository

Origin repository
UNICA