Published June 2013 | Version v1
Conference paper

Raman Investigation of Heavily Al Doped 4H-SiC Layers Grown by CVD

Description

Raman Investigation of Heavily Al Doped 4H-SiC Layers Grown by CVD

Abstract

International audience

Additional details

Identifiers

URL
https://hal.archives-ouvertes.fr/hal-01936666
URN
urn:oai:HAL:hal-01936666v1

Origin repository

Origin repository
UNICA