Theoretical and experimental characterization of TiO2 thin films deposited at oblique angles

Description

The microstructural features of amorphous TiO2 thin films grown by the electron beam physical vapour deposition technique at oblique angles have been experimentally and theoretically studied. The microstructural features of the deposited films were characterized by considering both, the column tilt angle and the increase of the column thickness with height. A Monte Carlo model of the film growth has been developed that takes into account surface shadowing, short-range interaction between the deposition species and the film surface, as well as the angular broadening of the deposition flux when arriving at the substrate. The good match between simulations and experimental results indicates the importance of these factors in the growth and microstructural development of thin films deposited at oblique angles.

Abstract

Ministerio de Innovación, MAT 2007-65764, CONSOLIDER INGENIO 2010-CSD2008-00023, PIE 200960I132

Abstract

Junta de Andalucía TEP2275, TEP5283, P07-FQM-03298, FQM-6900

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