Published 1996
| Version v1
Publication
Measuring Electrostatic Double-Layer Forces at high Surface Potentials with the Atomic Force Microscope
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Contributors
Additional details
Identifiers
- URL
- http://hdl.handle.net/11567/193473
- URN
- urn:oai:iris.unige.it:11567/193473
Origin repository
- Origin repository
- UNIGE