Published January 19, 2017
| Version v1
Publication
Gate-Level Simulation of CMOS Circuits Using the IDDM Model
Description
Timing verification of digital CMOS circuits is a
key point in the design process. In this contribution we present
the extension to gates of the Inertial and Degradation Delay
Model for logic timing simulation which is able to take account
of the propagation of arbitrarily narrow pulses. As a result, the
model is ready to be applied to the simulation and verification
of complex circuits. Simulation results show an accuracy similar
to HSPICE and greatly improved precision over conventional
delay models.
Abstract
Ministerio de Ciencia y Tecnología TIC 2000-1350Additional details
Identifiers
- URL
- https://idus.us.es/handle/11441/52452
- URN
- urn:oai:idus.us.es:11441/52452