Published September 20, 2018
| Version v1
Publication
The EKV/ACM compact models for mismatch modeling down to 90nm and for new emergent non-CMOS nanotechnology FETs
Additional details
- URL
- https://idus.us.es/handle//11441/78672
- URN
- urn:oai:idus.us.es:11441/78672
- Origin repository
- USE