Published 2023
| Version v1
Publication
Background Rejection in Two-Photon Fluorescence Image Scanning Microscopy
Description
We discuss the properties of signal strength and integrated intensity in two-photon excitation confocal microscopy and image scanning microscopy. The resolution, optical sectioning and background rejection are all improved over nonconfocal two-photon microscopy. Replacing the pinhole of confocal two-photon microscopy with a detector array increases the peak intensity of the point spread function. The outer pixels of a detector array give signals from defocused regions, and thus the processing of these, such as through subtraction, can further improve optical sectioning and background rejection.
Additional details
- URL
- https://hdl.handle.net/11567/1155676
- URN
- urn:oai:iris.unige.it:11567/1155676
- Origin repository
- UNIGE