Published August 2, 2020 | Version v1
Conference paper

Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

Description

International audience

Additional details

Identifiers

URL
https://hal.archives-ouvertes.fr/hal-02914700
URN
urn:oai:HAL:hal-02914700v1

Origin repository

Origin repository
UNICA