Published 2010
| Version v1
Journal article
Investigations of the effects of the growth of SnO<sub>2</sub> nanoparticles on the structural properties of glass–ceramic planar waveguides using Raman and FTIR spectroscopies
Contributors
Others:
- Laboratoire Avancé de Spectroscopie pour les Intéractions la Réactivité et l'Environnement - UMR 8516 (LASIRE) ; Institut de Chimie du CNRS (INC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)
- Centre d'Etudes et de Recherches Lasers et Applications (CERLA) ; Université de Lille, Sciences et Technologies
- Laboratoire de Physique des Lasers, Atomes et Molécules - UMR 8523 (PhLAM) ; Université de Lille-Centre National de la Recherche Scientifique (CNRS)
- Unité de Catalyse et Chimie du Solide - UMR 8181 (UCCS) ; Université d'Artois (UA)-Centrale Lille-Institut de Chimie du CNRS (INC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)
- Istituto di Fisica Applicata "Nello Carrara" (IFAC) ; Consiglio Nazionale delle Ricerche [Roma] (CNR)
- CSMFO group ; CNR Istituto di Fotonica e Nanotecnologie [Trento] (IFN) ; Consiglio Nazionale delle Ricerche [Roma] (CNR)-Consiglio Nazionale delle Ricerche [Roma] (CNR)
- Laboratoire de physique de la matière condensée (LPMC) ; Université Nice Sophia Antipolis (1965 - 2019) (UNS) ; COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-COMUE Université Côte d'Azur (2015-2019) (COMUE UCA)-Centre National de la Recherche Scientifique (CNRS)
Description
(100-x) SiO2–x SnO2 (x from 12 to 60 mol%) glass–ceramic thin films have been prepared by the sol–gel processing method, obtaining high SnO2 concentrations (up to 60 mol%) for the first time. Using an appropriate thermal process, SnO2 nanocrystals were nucleated in the glassy silica matrix, providing optical waveguides for x ≤ 30 mol%. M-line measurements were used to determine the thickness and refractive index of each film. Raman and FTIR spectroscopies, in situ high-temperature XRD and TEM data have been used to identify the initiation of crystallization (at about 900 °C for x ≤ 30 mol%). Calculations based on the low-wavenumber Raman data yield the sizes of the semi-conductor nanoparticles, which vary from 3.2 to 4.6 nm with heat-treatments varying from 900 °C to 1100 °C for SnO2 concentrations varying from 12 to 30 mol%. Raman and FTIR data have provided information on the structural evolutions of the matrix which result from the formation and the growth of the SnO2 nanocrystals.
Additional details
Identifiers
- URL
- https://hal.archives-ouvertes.fr/hal-00531347
- URN
- urn:oai:HAL:hal-00531347v1
Origin repository
- Origin repository
- UNICA