Published 2024
| Version v1
Publication
Fast thickness mapping of large-area exfoliated two-dimensional transition metal dichalcogenides by imaging spectroscopic ellipsometry
Additional details
Identifiers
- URL
- https://hdl.handle.net/11567/1228475
- URN
- urn:oai:iris.unige.it:11567/1228475
Origin repository
- Origin repository
- UNIGE