Published August 1, 2017
| Version v1
Publication
Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N2+ bombardment
Description
N2+ bombardment of Al2O3 has been investigated by near edge x-ray absorption fine structure spectroscopy. Two kinds of species were detected and were attributed to implanted nitrogen atoms and nitride species. These results are discussed in relation to previous attributions in the literature of these species to AlNO and AlN.
Abstract
Comisión Interministerial de Ciencia y Tecnología (CICYT) MAT97-0689
Additional details
- URL
- https://idus.us.es/handle/11441/63460
- URN
- urn:oai:idus.us.es:11441/63460
- Origin repository
- USE