BUZIO , Renato

Colloidal probe atomic force microscopy (AFM) allows us to explore sliding friction phenomena in graphite contacts of nominal lateral size up to hundreds of nanometers. It is known that contact formation involves tribo-induced material transfer of graphite flakes from the graphitic substrate to the colloidal probe. In this context, sliding...

We report on the fabrication, mechanical characterization and electrostatic actuation of dielectric STO(0 0 1) thin film microcantilevers (MCs). Finite element analysis (FEA) is used for mechanical analysis and for calculating the distribution and the magnitude of the dielectric forces on the actual devices. The actuation of insulating oxide...

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We investigated the plasmonic response of arrays of Al nanowires fabricated in high-vacuum and embedded within a transparent protective medium. The nanostructures exhibited a strongly-birefringent plasmonic response which, depending on the mutual orientation of the incident-field polarization and the nanowire axis, allowed the plasmon resonance...

Novel ballistic electron emission microscopy experiments are reported, aimed to directly visualize and quantify the local inhomogeneities of the effective Schottky barrier height on Au/Nb:SrTiO3 Schottky junctions dominated by interfacial resistance switching effects. The voltage-dependent variation of the local barrier height of the nanometric...