In this work, a series of AlGaN/GaN high electron mobility transistors (HEMTs) have been grown on patterned (Al)GaN-on-Si seed layers by metalorganic chemical vapor deposition (MOCVD) to study the effect of the (Al)GaN buffer thickness and its aluminum content on the vertical breakdown voltage. The atomic force microscopy (AFM) analysis...
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May 2023 (v1)Journal articleUploaded on: October 15, 2023
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June 7, 2018 (v1)Journal article
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January 2007 (v1)Journal article
New conditions for one‐step ELO were implemented to grow coalesced (11equation image0) non‐polar and (11equation image2) semi‐polar GaN layers starting, respectively, from R ‐ and M ‐plane sapphire. A great part of the stacking faults (SFs) and dislocations are filtrated resulting in GaN material with better structural and optical properties....
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July 7, 2019 (v1)Conference paper
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July 28, 2022 (v1)Journal article
A model to predict the ideal reverse leakage currents in Schottky barrier diodes, namely, thermionic emission and tunneling components, has been developed and tested by means of current–voltage–temperature measurements in GaN-on-SiC devices. The model addresses both current components and both forward and reverse polarities in a unified way and...
Uploaded on: December 3, 2022 -
March 2013 (v1)Journal article
The stress distribution on crack free thick continuous GaN film (12 mu m) grown by Metal organic chemical vapour deposition (MOCVD) on the arrays of different sizes of the patterned silicon substrate is investigated by micro-Raman (mu Raman) spectroscopy. On the largest crack free mesa (400 mu m) both mu-photoluminescence (mu PL) at low...
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March 2006 (v1)Journal article
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May 2005 (v1)Journal article
In this work, AlGaN/GaN high electron mobility transistors have been grown by ammonia source molecular beam epitaxy (MBE) on silicon (1 1 1), silicon carbide and GaN templates on sapphire. The structural and electrical properties of these layers have been studied in order to determine the impact of substrate choice and buffer layer on active...
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2021 (v1)Journal article
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Uploaded on: February 22, 2023 -
2021 (v1)Journal article
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May 19, 2023 (v1)Journal article
AbstractQuasi-vertical gallium nitride (GaN) Schottky diodes on silicon carbide (SiC) substrates were fabricated for frequency multiplier applications. The epitaxial structure employed had an n− layer of 590 nm with doping 6.6 × 1016 cm−3, while the n+ layer was 950 nm thick, with doping 2 × 1019 cm−3. Potassium hydroxide (KOH) chemical surface...
Uploaded on: June 4, 2023 -
2021 (v1)Journal article
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October 24, 2021 (v1)Conference paper
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Uploaded on: March 25, 2023 -
2021 (v1)Journal article
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September 19, 2022 (v1)Conference paper
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October 9, 2022 (v1)Conference paper
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Uploaded on: March 25, 2023 -
2022 (v1)Journal article
We report on a GaN/AlGaN quantum cascade detector operating in the terahertz spectral range. The device was grown by metal organic chemical vapor deposition on a c-sapphire substrate and relies on polar GaN/AlGaN step quantum wells. The active region thickness is in micrometer range. The structural, electrical, and optical investigations attest...
Uploaded on: December 3, 2022