G

R

GAILLARD , R.

Last name: GAILLARD

First name: R.

2006 (v1)

Conference paper

Metadata-only

Prediction of transients induced by neutrons/protons in CMOS combinational logic cells

Hubert, A. Bougerol, A. Miller, F.

This paper presents a new Monte-Carlo methodology to investigate the transient effect occurrence in complementary metal oxide semiconductor (CMOS) logic circuits: TMC DASIE (transient Monte-Carlo detailed analysis of secondary ion effects). The production and effects of single-event transients inside CMOS combinational logic gates are examined....

Uploaded on: February 28, 2023