G

J

GASIOT , J.

Last name: GASIOT

First name: J.

2005 (v1)

Journal article

Metadata-only

Criterion for SEU Occurrence in SRAM Deduced From Circuit and Device Simulations in Case of Neutron-Induced SER

Mérelle, T. Chabane, H. Palau, J.-M.

A reliable criterion for SEU occurrence simulation is presented. It expresses the relationship existing at threshold between the magnitude and duration of the ion-induced parasitic pulse. This criterion can be obtained byboth three-dimensional device and SPICE simulations. Using this criterion, the simulated and experimental SER on 130 and 250...

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