HUGUES , Maxime

In this work, ammonia source molecular beam epitaxy is explored as an alternative technique to grow ScAlN/GaN high electron mobility transistor heterostructures on a silicon substrate with thin buffer layers. The effect of ScAlN barrier thickness is investigated. A transistor with a maximum drain current superior to 1 A mm −1 has been...

International audience

In this work, ammonia source molecular beam epitaxy is explored as an alternative technique to grow ScAlN/GaN High Electron Mobility Transistor heterostructures. The effect of growth temperature and ScAlN barrier thickness on 2dimensional electron gas density is investigated with capacitancevoltage measurements. A transistor with a maximum...

International audience