LÉGER , Gildas

Alternate Test has demonstrated in the last decade that advanced machine-learning tools can leverage the accuracy gap between functional test and indirect, or model-based, test. If a regression approach is taken, a model should be trained for each specification. The advantage is that the results are interpreted just like performance...

The test of modulators is cumbersome due to the high performance they reach. Moreover, technology scaling trends raise serious doubts on the intra-die repeatability of devices. Increase of variability will lead to an increase in parametric faults difficult to detect. In this paper, a designoriented testing approach is proposed to perform...

This paper proposes a digital technique to evaluate the integrator leakage within 1st and 2nd order ΣΔ modulators. Integrator leakage is known to be related to the converter precision and belongs to the basic set of design specifications. The technique proposed here involves very few hardware, which makes it specially suitable for Built-In...

This paper presents a simple and fully digital solution to correct the effect of amplifier finite gain in cascade ΣΔ modulators. The main contribution of this letter is a simple digital method to evaluate the integrator pole errors, which are further taken into account to modify the reconstruction filter. The method is applied to a 2-1 cascade...

The cost of Analogue and Mixed-Signal circuit testing is an important bottleneck in the industry, due to timeconsuming verification of specifications that require state-ofthe- art Automatic Test Equipment. In this paper, we apply the concept of Alternate Test to achieve digital testing of converters. By training an ensemble of regression...

This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.

Σ∆ modulators make a clever use of oversampling and exhibit inherent monotonicity, high linearity and large dynamic range but a restricted frequency range. As a result Σ∆ modulators are often the preferred option for sensor and instrumentation. Offset and Flicker noise are usual concerns for this type of applications and one way to...

This paper presents a novel and low-cost methodology for testing embedded Low Noise Amplifiers (LNAs). It is based on the detection and analysis of the response envelope of the Device Under Test (DUT) to a two-tone input signal. The envelope signal is processed to obtain a digital signature sensitive to key specifications of the DUT. An...

Analog-to-digital converters based on ΣΔ modulators are used in a wide variety of applications. Due to their inherent monotonous behavior, high linearity, and large dynamic range, they are often the preferred option for sensor and instrumentation. Offset and flicker noise are usual concerns for this type of applications, and one way to minimize...

Using several ADCs (Analog to Digital Converters) in parallel with convenient time offsets is considered as an efficient way to push the speed limits of data acquisition systems. However, a serious drawback of this time-interleaving technique is that any mismatch between the channels will damage the precision. This paper gives a probabilistic...

This paper presents a simulation-based method for evaluating the static offset in discrete-time comparators. The proposed procedure is based on a closed-loop algorithm which forces the input signal of the comparator to quickly converge to its effective threshold. From this value, the final offset is computed by subtracting the ideal reference....

This work presents a technique for the on- chip generation of analog sinusoidal signals with high spectral quality and reduced circuitry resources. The proposed generation technique consists of a modi ed low-order analog lter, that provides a sinusoidal out- put as response to a DC input, combined with a har- monic cancellation strategy to...

This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results...