International audience
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September 10, 2007 (v1)Conference paperUploaded on: December 4, 2022
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December 2002 (v1)Journal article
A Monte Carlo approach is used to obtain statistical information on the effect of the spatial distribution of the numerous secondary ions involved in neutron induced soft error rates (SER). The sorting criteria for the occurrence of upset are derived from a simplification of previous work on full-cell three-dimensional (3-D) SRAM device...
Uploaded on: December 4, 2022 -
2005 (v1)Journal article
A reliable criterion for SEU occurrence simulation is presented. It expresses the relationship existing at threshold between the magnitude and duration of the ion-induced parasitic pulse. This criterion can be obtained byboth three-dimensional device and SPICE simulations. Using this criterion, the simulated and experimental SER on 130 and 250...
Uploaded on: December 4, 2022