CHAUVAT , Marie-Pierre

In this work, strain relaxation in green-red emitting InGaN/GaN quantum well (QW) structures are investigated by transmission electron microscopy. In these structures, high indium content QW strain relaxation takes place through hexagonal domains formation inside GaN barrier just on QW top. With In increases, domains become limited by I1...

For the next-generation solid state lighting, the production of high quality semipolar (112¯2) GaN layers on sapphire obtained using asymmetric epitaxial lateral overgrowth (ELO) method has been investigated. This type of ELO leads to efficient blocking of the basal stacking faults (BSFs) in the bulk, and enables the formation of nondefective...

The defect structures in semipolar (11¯22)-GaN, AlN layers grown on m-sapphire by metal organic vapor phase epitaxy (MOVPE) and molecular beam epitaxy (MBE) are characterized by transmission electron microscopy. The epitaxial relationships are identified as [10¯10]GaN ǁ [11¯20]sap and [1¯213]GaN ǁ [0001]sap. Defects are identified as mostly...

In this work, InGaN/GaN Multi-Quantum Wells (MQWs) with strain compensating AlGaN interlayers grown by metalorganic vapour phase epitaxy have been investigated by high resolution X-ray diffraction, transmission electron microscopy and photoluminescence (PL). For different AlGaN strain compensating layer thicknesses varying from 0 to 10.6 nm, a...

A porous InGaN/GaN blue light-emitting diode is demonstrated using selective area sublimation. Transmission electron microscopy reveals that the structure is porous down to the Si substrate; however, the porosity is higher in the GaN buffer, while smaller pores are observed in the active region. This change of porosity between the active region...