DELLA MARCA , V.

Last name: DELLA MARCA

First name: V.

April 16, 2018 (v1)

Conference paper

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A new method for test chip and single 40nm NOR Flash cell electrical parameters correlation using a CAST structure

Kempf, T. Della Marca, V. Canet, P.

International audience

Uploaded on: December 4, 2022
September 2018 (v1)

Journal article

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Quantitative correlation between Flash and equivalent transistor for endurance electrical parameters extraction

Della Marca, V. Postel-Pellerin, J. Kempf, T.

Nowadays, the study of physical mechanisms that occur during Flash memory cell life is mandatory when reaching the 40nm and beyond nodes in terms of reliability. In this paper we carry out a complete experimental method to extract the floating gate potential evolution during the cell aging. The dynamic current consumption during a Channel Hot...

Uploaded on: December 4, 2022
March 11, 2018 (v1)

Conference paper

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Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip

Kempf, T. Della Marca, V. Baron, L.

The reliability requirements of Flash memory become more and more challenging. Flash memory technology development needs test chips to allow large statistical studies and a product-like approach. In this paper, we present a methodology of bitmap analysis to extract and follow the intrinsic and extrinsic parameters of a 40nm eFlash technology...

Uploaded on: December 4, 2022
October 8, 2017 (v1)

Conference paper

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Impact of CMOS Post Nitridation Annealing on Reliability of 40nm 512kB Embedded Flash Array

Kempf, Thibault Mantelli, Marc Maugain, François

International audience

Uploaded on: December 4, 2022

DELLA MARCA , V.

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